K47910 Benchtop EDXRF Elemental Analyzer |
Specifications Conforms to the specifications of: ASTM D4294, D5059, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1 Excitation: 50 kV X-Ray Tube 4W Maximum Power 6 Tube Filter Positions with Optics Spill/Contamination Protection Detection: High Performance Silicon Drift Semiconductor Detector Peltier Thermo-Electric Cooling High Spectral Resolution and Count Rate Detection Limits (LLD): Sulfur: 2 ppm in Air (1.3 ppm in He) Nickel: 1.5 ppm Vanadium: 0.6 ppm Lead: 0.0003 g/L Sample Chamber: Large 190 x 165 x 60 mm sample chamber Single Position 32 mm sample aperture Single Position 40 mm sample aperture Bulk Sample Aperture User Interface: 8” WVGA Touch Screen Interface Embedded Computer Internal Thermal Printer USB & Ethernet Connections Environmental Conditions: Ambient Temperatures 10 - 35°C (50 - 95°F) Relative Humidity < 85% non-condensing Vibration undetectable by human Free from corrosive gas, dust, and particles Electrical Requirements: 100/240V, 1.4A, 50/60Hz Single Phase AC Dimensions wxdxh,in.(cm) 13 x 17 x 14.8 (33.1 x 43.2 x 37.6) Net Weight: 35 lbs (16 kg) |
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