K47900 Benchtop EDXRF Elemental Analyzer |
Specifications Conforms to the specifications of: ASTM D4294, D5059, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1 Excitation: 50 kV X-Ray Tube 4W Maximum Power 6 Tube Filter Positions with Optics Spill/Contamination Protection Detection: High Performance Si PIN Diode Detector Peltier Thermo-Electric Cooling Optimum Balance of spectral resolution and max count rate Detection Limits (LLD): Sulfur: 5 ppm in Air (3 ppm in He) Nickel: 1.6 ppm Vanadium: 3.6 ppm Iron: 2.7 ppm Lead: 0.0004 g/L Sample Chamber: Large 190 x 165 x 60 mm sample chamber Single Position 32 mm sample aperture Single Position 40 mm sample aperture Bulk Sample Aperture User Interface: 8” WVGA Touch Screen Interface Embedded Computer Internal Thermal Printer USB & Ethernet Connections Environmental Conditions: Ambient Temperatures 10 - 35°C (50 - 95°F) Relative Humidity < 85% non-condensing Vibration undetectable by human Free from corrosive gas, dust, and particles Electrical Requirements: 100/240V, 1.4A, 50/60Hz Single Phase AC Dimensions wxdxh,in.(cm) 13 x 17 x 14.8 (33.1 x 43.2 x 37.6) Net Weight: 35 lbs (16 kg) |
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