K47920 Benchtop EDXRF Elemental Analyzer |
Specifications Conforms to the specifications of: ASTM D4294, D5059, D7220, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1 Excitation: 50 kV X-Ray Tube with Pd Anode 50W Maximum Power 4 Standard Polarization and Secondary Targets depending on application, for optimum excitation Optional Fifth Target for Optimal Excitation of Na and Mg Detection: High Performance Silicon Drift Semiconductor Detector Peltier Electronic Cooling Optimum Balance of spectral resolution and high count rate Detection Limits (LLD): Sulfur: 0.54 ppm Chlorine: 0.3 ppm Lead: 0.0002 g/L Nickel and Vanadium: 1 ppm Iron: 2 pp, Sample Chamber: Large 38cm dia. X 10cm deep sample chamber for bulk samples 15-Position Automatic Sample Changer (32mm Sample Cups) Analysis in Air, Helium Purge, or Vacuum Available User Interface (Computer): External PC Computer System including: Microsoft Windows Vista Operating System Keyboard and Mouse, Monitor Printer Environmental Conditions: Ambient Temperatures 18 - 28°C (65 - 82°F) Relative Humidity < 75% Vibration undetectable by human Free from corrosive gas, dust, and particles Electrical Requirements: 100/240V, 1.4A, 50/60Hz Single Phase AC Dimensions wxdxh,in.(cm) 23.6 x 23.6 x 15.7 (60 x 60 x 40) Net Weight: 127 lbs (80 kg) |
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